Abstract
The optical constants of RF planar magnetron sputtered Ni-Al2O3 films are reported for the 0.3-2.5 μm wavelength range. The data are interpreted in terms of Maxwell-Garnett and Bruggeman effective medium theories. The effect of atomic Ni dispersion in the Al2O3 matrix on the effective medium formalism is discussed.
Original language | English |
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Pages (from-to) | 769-775 |
Number of pages | 7 |
Journal | Journal of Physics D: Applied Physics |
Volume | 30 |
Issue number | 5 |
DOIs | |
Publication status | Published - Mar 7 1997 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Acoustics and Ultrasonics
- Surfaces, Coatings and Films