This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor in Chief due to very significant similarity between it and another published article by the same author (“Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering”, by Olayinka Oluwatosin Abegunde, Esther Titilayo Akinlabi, Philip Oluseyi Oladijo, Data in Brief, Vol 29, 105205, January 2020 https://doi.org/10.1016/j.dib.2020.105205) and the clear duplication of figures and tables.
All Science Journal Classification (ASJC) codes
- Condensed Matter Physics
- Physics and Astronomy(all)
- Surfaces and Interfaces
- Surfaces, Coatings and Films