On electrors-beam-induced charging effects in Cu- and Y-deposited LaAIO3surfaces

Jens E T Andersen, Preben J. Müller

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Electron-impact experiments on insulator and wide-band-gap semiconductor surfaces are disturbed by charging effects, particularly in cases of stoichiometric surfaces. We have studied the shift in kinetic energy of Auger electrons from 1 X 1 LaA103 100) surfaces as a function of Cu coverage, time of electron-beam bombardment, heat treatment, and—also for an Y deposited 1X 1 LaA103 100) surface—of primary beam energy. The energy shift is found to increase with metal coverage and with primary beam energy. It is suggested that at a particular energy the incident electrons result in a repulsive potential from which escaping Auger electrons gain kinetic energy, and that the initially deposited metal atoms may cause moving of electrons into valence-band states created by hybridization of surface metal and oxygen states. For comparison, the energy shifts in nondeposited LaA103100), MgO(lOO), and SrTiO3100) were also investigated.

Original languageEnglish
Pages (from-to)497-500
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume10
Issue number3
DOIs
Publication statusPublished - Jan 1 1992

Fingerprint

charging
Electrons
Metals
Kinetic energy
shift
electrons
kinetic energy
energy
Valence bands
metals
electron impact
metal surfaces
bombardment
Electron beams
heat treatment
Heat treatment
insulators
electron beams
Oxygen
broadband

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

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On electrors-beam-induced charging effects in Cu- and Y-deposited LaAIO3surfaces. / Andersen, Jens E T; Müller, Preben J.

In: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 10, No. 3, 01.01.1992, p. 497-500.

Research output: Contribution to journalArticle

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