On electrors-beam-induced charging effects in Cu- and Y-deposited LaAIO3surfaces

Jens E T Andersen, Preben J. Müller

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Electron-impact experiments on insulator and wide-band-gap semiconductor surfaces are disturbed by charging effects, particularly in cases of stoichiometric surfaces. We have studied the shift in kinetic energy of Auger electrons from 1 X 1 LaA103 100) surfaces as a function of Cu coverage, time of electron-beam bombardment, heat treatment, and—also for an Y deposited 1X 1 LaA103 100) surface—of primary beam energy. The energy shift is found to increase with metal coverage and with primary beam energy. It is suggested that at a particular energy the incident electrons result in a repulsive potential from which escaping Auger electrons gain kinetic energy, and that the initially deposited metal atoms may cause moving of electrons into valence-band states created by hybridization of surface metal and oxygen states. For comparison, the energy shifts in nondeposited LaA103100), MgO(lOO), and SrTiO3100) were also investigated.

Original languageEnglish
Pages (from-to)497-500
Number of pages4
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume10
Issue number3
DOIs
Publication statusPublished - Jan 1 1992

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this