Matrix-effect correction in oxide crystal Auger electron spectroscopy

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A simple model is presented for the calculation of surface elemental composition, surface impurity content and surface chemical termination in complex oxide crystal surfaces. The model is based upon Auger electron spectroscopic measurements and takes electronic inelastic mean free paths or attenuation lengths and bulk crystallographic data into consideration. Different results are obtained when using either the attenuation length or the electronic inelastic mean free path for the surfaces stoichiometric weights. MgO(100), SrTiO3(100), LaAlO3(100), and YBa2Cu3O7-x (001) are used as test samples. Uncertainties are estimated at 10-20%.

Original languageEnglish
Pages (from-to)337-349
Number of pages13
JournalSurface Science
Volume243
Issue number1-3
DOIs
Publication statusPublished - Feb 2 1991

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Matrix-effect correction in oxide crystal Auger electron spectroscopy'. Together they form a unique fingerprint.

  • Cite this