Influence of thickness on optical properties of a-(Se80Te 20)96Ag4 thin films

D. Singh, S. Kumar, R. Thangaraj, T. S. Sathiaraj

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Bulk sample of (Se80Te20)96Ag4 was prepared by quenching technique. Thin films of (Se80Te 20)96Ag4 glasses of different thickness (500-950 nm) were deposited on dry clean glass substrates by thermal evaporation technique. Energy dispersive X-ray spectroscopy (EDX) indicates that samples are nearly stoichiometric. X-ray diffraction patterns indicate that they are in the amorphous state. The optical constants, refractive index, absorption index, and optical band gap have been calculated from transmittance and reflectance data in spectral range of 400-2500 nm. It has been found that the optical band gap decreases, but the refractive index, extinction coefficient, optical conductivity, real and imaginary dielectric constant increase with increase in thickness of (Se80Te20)96Ag4 thin films. The results are discussed on the basis of rearrangements of defects and disorders in the chalcogenide systems.

Original languageEnglish
Pages (from-to)119-125
Number of pages7
JournalPhysica B: Condensed Matter
Volume408
Issue number1
DOIs
Publication statusPublished - Jan 1 2013

Fingerprint

Optical band gaps
Refractive index
Optical properties
refractivity
Optical conductivity
optical properties
Glass
Thin films
Optical constants
Thermal evaporation
glass
thin films
Diffraction patterns
Quenching
transmittance
extinction
x rays
Permittivity
diffraction patterns
quenching

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Singh, D. ; Kumar, S. ; Thangaraj, R. ; Sathiaraj, T. S. / Influence of thickness on optical properties of a-(Se80Te 20)96Ag4 thin films. In: Physica B: Condensed Matter. 2013 ; Vol. 408, No. 1. pp. 119-125.
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Influence of thickness on optical properties of a-(Se80Te 20)96Ag4 thin films. / Singh, D.; Kumar, S.; Thangaraj, R.; Sathiaraj, T. S.

In: Physica B: Condensed Matter, Vol. 408, No. 1, 01.01.2013, p. 119-125.

Research output: Contribution to journalArticle

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AB - Bulk sample of (Se80Te20)96Ag4 was prepared by quenching technique. Thin films of (Se80Te 20)96Ag4 glasses of different thickness (500-950 nm) were deposited on dry clean glass substrates by thermal evaporation technique. Energy dispersive X-ray spectroscopy (EDX) indicates that samples are nearly stoichiometric. X-ray diffraction patterns indicate that they are in the amorphous state. The optical constants, refractive index, absorption index, and optical band gap have been calculated from transmittance and reflectance data in spectral range of 400-2500 nm. It has been found that the optical band gap decreases, but the refractive index, extinction coefficient, optical conductivity, real and imaginary dielectric constant increase with increase in thickness of (Se80Te20)96Ag4 thin films. The results are discussed on the basis of rearrangements of defects and disorders in the chalcogenide systems.

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