Effect of Sn addition on the optical gap and far-infrared reflectivity spectra of amorphous Sb-Se films

Praveen Kumar, R. Thangaraj, T. S. Sathiaraj

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

This paper reports the spectroscopic studies on the thermally evaporated SnxSb20Se80 - x (2 ≤ x ≤ 8) films. Optical gap and band tailing parameter decreases except for x = 8, where it increases. The red shift in peak reflectivity spectrum in the interband transition region (200-800 nm) has been observed. The position and shape of the reflectivity bands (80-378 cm- 1) indicate the change in the local structure of the films. The Kramer-Kronig transformations have been used to evaluate the dielectric constants from the far-infrared reflectivity spectrum. Splitting of the longitudinal optic and transverse optic mode characterizes the partial ionic character for Sn-Sb-Se system. The relationship between the optical properties and structure has been revealed.

Original languageEnglish
Pages (from-to)1611-1613
Number of pages3
JournalJournal of Non-Crystalline Solids
Volume356
Issue number31-32
DOIs
Publication statusPublished - Jun 23 2010

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Infrared radiation
reflectance
Optics
optics
Tailings
red shift
Permittivity
Optical properties
permittivity
optical properties

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

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Effect of Sn addition on the optical gap and far-infrared reflectivity spectra of amorphous Sb-Se films. / Kumar, Praveen; Thangaraj, R.; Sathiaraj, T. S.

In: Journal of Non-Crystalline Solids, Vol. 356, No. 31-32, 23.06.2010, p. 1611-1613.

Research output: Contribution to journalArticle

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