Determination of surface stoichiometry in polycrystalline alloys by a crystallographic electron attenuation model: Application to the Ce/Rh system

J. E.T. Andersen, J. P. Warren, X. Zhang, R. M. Lambert

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In order to obtain quantitative surface compositional information, an earlier crystallographic electron attenuation model has been extended to treat polycrystalline alloys. Simple correction factors are obtained that yield large corrections to elemental Auger intensity ratios. The model has been applied to a binary surface alloy formed by heating cerium overlayers on a polycrystalline rhodium substrate. It is shown that an alloy film is formed whose thickness is proportional to the number of Ce layers initially deposited. The surface alloy is identified as Ce3Rh2, which corresponds to a known bulk phase.

Original languageEnglish
Pages (from-to)576-580
Number of pages5
JournalSurface and Interface Analysis
Volume21
Issue number8
DOIs
Publication statusPublished - Jan 1 1994

Fingerprint

Stoichiometry
stoichiometry
attenuation
Electrons
electrons
Cerium
Rhodium
cerium
rhodium
Heating
heating
Substrates

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

@article{dbfd890464bd4a25bc47085e8ca1223b,
title = "Determination of surface stoichiometry in polycrystalline alloys by a crystallographic electron attenuation model: Application to the Ce/Rh system",
abstract = "In order to obtain quantitative surface compositional information, an earlier crystallographic electron attenuation model has been extended to treat polycrystalline alloys. Simple correction factors are obtained that yield large corrections to elemental Auger intensity ratios. The model has been applied to a binary surface alloy formed by heating cerium overlayers on a polycrystalline rhodium substrate. It is shown that an alloy film is formed whose thickness is proportional to the number of Ce layers initially deposited. The surface alloy is identified as Ce3Rh2, which corresponds to a known bulk phase.",
author = "Andersen, {J. E.T.} and Warren, {J. P.} and X. Zhang and Lambert, {R. M.}",
year = "1994",
month = "1",
day = "1",
doi = "10.1002/sia.740210811",
language = "English",
volume = "21",
pages = "576--580",
journal = "Surface and Interface Analysis",
issn = "0142-2421",
publisher = "John Wiley and Sons Ltd",
number = "8",

}

Determination of surface stoichiometry in polycrystalline alloys by a crystallographic electron attenuation model : Application to the Ce/Rh system. / Andersen, J. E.T.; Warren, J. P.; Zhang, X.; Lambert, R. M.

In: Surface and Interface Analysis, Vol. 21, No. 8, 01.01.1994, p. 576-580.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Determination of surface stoichiometry in polycrystalline alloys by a crystallographic electron attenuation model

T2 - Application to the Ce/Rh system

AU - Andersen, J. E.T.

AU - Warren, J. P.

AU - Zhang, X.

AU - Lambert, R. M.

PY - 1994/1/1

Y1 - 1994/1/1

N2 - In order to obtain quantitative surface compositional information, an earlier crystallographic electron attenuation model has been extended to treat polycrystalline alloys. Simple correction factors are obtained that yield large corrections to elemental Auger intensity ratios. The model has been applied to a binary surface alloy formed by heating cerium overlayers on a polycrystalline rhodium substrate. It is shown that an alloy film is formed whose thickness is proportional to the number of Ce layers initially deposited. The surface alloy is identified as Ce3Rh2, which corresponds to a known bulk phase.

AB - In order to obtain quantitative surface compositional information, an earlier crystallographic electron attenuation model has been extended to treat polycrystalline alloys. Simple correction factors are obtained that yield large corrections to elemental Auger intensity ratios. The model has been applied to a binary surface alloy formed by heating cerium overlayers on a polycrystalline rhodium substrate. It is shown that an alloy film is formed whose thickness is proportional to the number of Ce layers initially deposited. The surface alloy is identified as Ce3Rh2, which corresponds to a known bulk phase.

UR - http://www.scopus.com/inward/record.url?scp=0028482135&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028482135&partnerID=8YFLogxK

U2 - 10.1002/sia.740210811

DO - 10.1002/sia.740210811

M3 - Article

AN - SCOPUS:0028482135

VL - 21

SP - 576

EP - 580

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 8

ER -