Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240] (DOI:10.1016/j.msea.2006.04.080)

Yifang Cao, Seyed Allameh, Derek Nankivil, T. Stephen Sathiaraj, Tom Otiti, Wole Soboyejo

Research output: Contribution to journalComment/debate

2 Citations (Scopus)
Original languageEnglish
Number of pages1
JournalMaterials Science and Engineering A
Volume494
Issue number1-2
DOIs
Publication statusPublished - 2008

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

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