Corrigendum: Atomic force microscopy analysis of surface topography of pure thin aluminum films (Materials Research Express (2018) 5 (046416) DOI: 10.1088/2053-1591/aabe1b)

F. M. Mwema, O. P. Oladijo, T. S. Sathiaraj, E. T. Akinlabi

Research output: Contribution to journalComment/debate

Abstract

Wehave noticed an error we made during the final submission of our article for production in figure 5, page 8 of our article published in Material Research Express (DOI: https://doi.org/10.1088/2053-1591/aabe1b).We have therefore provided the correct version of figure 5 in this corrigendum. The figure 5 currently appearing has a repetition of sub-figures a and b. (Figure Presented). The corrected figure 5 should include c and d sub-figures and should appear as follows; (Figure Presented).

Original languageEnglish
Article number099501
JournalMaterials Research Express
Volume6
Issue number9
DOIs
Publication statusPublished - Jul 12 2019

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Polymers and Plastics
  • Metals and Alloys

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