A new cell design for potentiostatically controlled in situ atomic force microscopy

L. L. Madsen, E. P. Friis, J. E T Andersen, P. Møller, J. Ulstrup

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

We describe the design and construction of a new type of AFM cell for in situ imaging under potentiostatic control. The cell is specifically designed for a Rasterscope 4000™ AFM instrument with no need for instrumental modification, but can easily be adapted to other commercial instruments. The cell is a closed system with insignificant sample evaporation. It is a chemically and mechanically robust two-component system which enables fast assembly and testing prior to insertion and minimizes leakage problems. The cell is also laterally flexible, facilitating scanning of large areas, holds inlets for rapid flushing and change of solution, and contains an optical device for adjusting the laser beam deflection in aqueous and gas ambient environments. Cyclic voltammetry of a simple redox couple and combined cyclic voltammetry and in situ AFM of copper deposition/dissolution cycles testify to perfect cell performance.

Original languageEnglish
JournalApplied Physics A: Materials Science and Processing
Volume66
Issue numberSUPPL. 1
DOIs
Publication statusPublished - 1998

Fingerprint

Cyclic voltammetry
Atomic force microscopy
Optical devices
Laser beams
Copper
Dissolution
Evaporation
Gases
Scanning
Imaging techniques
Testing
Oxidation-Reduction

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Chemistry(all)

Cite this

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A new cell design for potentiostatically controlled in situ atomic force microscopy. / Madsen, L. L.; Friis, E. P.; Andersen, J. E T; Møller, P.; Ulstrup, J.

In: Applied Physics A: Materials Science and Processing, Vol. 66, No. SUPPL. 1, 1998.

Research output: Contribution to journalArticle

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